The LucentTM AFM is a novel patented system that combines AFM
with Laser Scanning Microscopy (LSM). A high level of automation
and user guided features make it an easy to operate AFM with
advanced functionality.
Obtain resolution optical images and zoom to features of interest for AFM imaging.
A feature rich,
versatile
AFM with multiple add-ons and modules for your specific needs.
Novel
LSM + AFM
Easy tip
exchange
Convenient sample
placement
Liquid chamber /
Electrochemistry chamber
Dr. Ashwin Lal, Ph.D
Founder
EPEL, McGill University
Dr. Sanjiv Shrivastava
Ph.D Application specialist
Witwatersrand University
Dr. Shomnath Bhowmick,
Ph.D Business Development
IMM-CNR, Federico II University
Founded in 2013 Shilps Sciences has been offering Nanotechnology and AFM solutions to various academic and industry
clients. We solve acute problems in nanoscale characterization. Our flagship AFM uses a unique combination of AFM with
Laser Scanning Microscopy for correlational imaging, newer insights and faster results.