LUCENTTM ATOMIC FORCE MICROSCOPE

The LucentTM AFM is a novel patented system that combines AFM with Laser Scanning Microscopy (LSM). A high level of automation and user guided features make it an easy to operate AFM with advanced functionality.

Obtain resolution optical images and zoom to features of interest for AFM imaging.

Get your crucial research data in no time.

Brochure

Specifications

A feature rich, versatile AFM with multiple add-ons and modules for your specific needs.

Novel
LSM + AFM

Easy tip
exchange

Convenient sample
placement

Liquid chamber /
Electrochemistry chamber

Dr. Ashwin Lal, Ph.D
Founder
EPEL, McGill University

Dr. Sanjiv Shrivastava
Ph.D Application specialist
Witwatersrand University

Dr. Shomnath Bhowmick,
Ph.D Business Development
IMM-CNR, Federico II University

Founded in 2013 Shilps Sciences has been offering Nanotechnology and AFM solutions to various academic and industry clients. We solve acute problems in nanoscale characterization. Our flagship AFM uses a unique combination of AFM with Laser Scanning Microscopy for correlational imaging, newer insights and faster results.

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